Researchers develop high-resolution electron microscopy for high-energy scanning electron microscope
A team of researchers from India’s Madras Institute of Technology and the University of Maryland have developed a new scanning electron microscopically-enhanced electron microscopic system for high energy scanning electron microscopic (SEM) imaging of single-molecule structures.
The team, led by Professor B. S. Krishnan, developed a single-atom-thick, single-coated silicon carbide nanoparticle (SiCMN) nanoparticle and applied it to an electron microscope.
The nanoparticle is coated with a thin layer of a semiconductor polymer.
The nanoparticle can be used to enhance the resolution of a scanning electron microscope by as much as 50%.
The researchers also discovered a new mode of scanning electron (SME) imaging by using SiCMN nanoparticles, which allows the scanning electron to be focused and focused-on to the desired site.
The new nanocomposite nanoparticle enables a new type of scanning method called SEM scanning.
SEM is the study of small, nanoscale structures that are able to be studied at high resolution.
The researchers are planning to commercialize the technology by 2021.
The research is published in the journal Nanoscale Letters.
Source: Madras News Service